Journal of Electronic Science and Technology

About the JEST

Editorial Board of JEST

JEST (International)

Journal of Electronic Science and Technology

ISSN: 1674-862X    http://www.intl-jest.com

 

¨ Fully indexed by Ei INSPEC, CA, DOAJ, CAOD, CNKI, Sciencepaper Online, Wanfang Data, Weipu Data 

¨ Collaborated with IEEE, IACSIT, and IET

 

JEST (International) covers the state-of-the-art achievements in electronic science and technology, including the most highlight areas:

 

¨ Communication Technology

¨ Computer Science and Information Technology

¨ Information and Network Security

¨ Bioelectronics and Biomedicine

¨ Neural Networks and Intelligent Systems

¨ Electronic Systems and Array Processing

¨ Optoelectronic and Photonic Technologies

¨ Electronic Materials and Devices

¨ Sensing and Measurement

¨ Signal Processing and Image Processing

 

JEST (International) is dedicated to building an open, high-level academic journal supported by researchers, professionals, and academicians. The Journal has been fully indexed by Ei INSPEC and has published, with great honor, the contributions from more than 20 countries and regions in the world. The authors are with more than 70 universities or institutions from the following contries . Welcome researchers all over the world to add their countries and institutions into the Map!

 America Australia  Bangladesh   Canada   China  (Mainland     Taiwan    Hong Kong)
 Denmark   Finland   France  Germany  Iran 
 India    Japan  Korea  Malaysia  New Zealand
 Oman  Pakistan  Rusia  Saudi Arabia  Serbia 
 Singapore   Spain  Sweden  United Kingdom  

 

                                            

 

JEST (International) is devoted to providing rapid publication of peer-reviewed manuscripts. All original, high quality contributions that are not yet published or that are not currently under review by other journals or conferences are welcomed. Manuscripts should be submitted by email to journal@intl-jest.com, more details are available at http://www.intl-jest.com.

Updated at 2010-08-30